Chroma Package Level Test

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Wafer Level Test

Package Level Test

Package Level Test

PhotonicsModuleTestSystem Model58625

Photonics Module Test System
Model 58625

All-in-one test system
Flexible test station arrangement
Precise temperature control -20~85℃
Large beam angle measurement

HighChannelDensityBurn-inTester Model58604-C

High Channel Density Burn-in Tester
Model 58604-C

Use with chamber or oven for burn-in, reliability and life test
Auto Current Control (ACC), and Auto Voltage Control (AVC) modes
Modular design for easy customization and maintenance
Comprehensive ESD protection
Independent channels for source and measurement

LaserDiodeBurn-inandReliabilityTestSystem Model58604

Laser Diode Burn-in and Reliability Test System
Model 58604

Applicable for burn-in, reliability and life testing
ACC and APC burn-in modes
Individual channel driving and measurement. Up to 500mA per channel or parallel up
Precise temperature control up to 125°C
Independent module operation

HighPowerLaserDiodeBurn-InandReliabilityTestSystem Model58605

High Power Laser Diode Burn-In and Reliability Test System
Model 58605

Burn-in, reliability and life test
ACC and APC control modes
Independent channel for source and measurement
Spike-Free sourcing
Up to 6000 mA per channel and pulsing

PhotodiodeBurn-inandReliabilityTestSystem Model58606

Photodiode Burn-in and Reliability Test System
Model 58606

Burn-in, reliability and life test
Dark Current and Breakdown Voltage
256 channels Bi-polar device source per drawer
High bias source to 80 volts

LaserDiodeCharacterizationSystem Model58620

Laser Diode Characterization System
Model 58620

Full turnkey automated test for edge-emitting laser diodes
High precision and large capacity carrier, interchangeable with other automated equipment
Fully automated alignment for fiber-coupled tests

LaserDiodeReliability,Burn-InandLife-TestSystem Model58602

Laser Diode Reliability, Burn-In and Life-Test System
Model 58602

Burn-In, Reliability and Life Testing
Up to 4608 Channels
Up to 20A per device

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